Markets: Automotive | Semiconductor industry | Power electronics

Test methods: Functional | Parameter | High Power | Parallel

Handling: Fully automatic (in-line) | Half automatic | Manual

Key Features: Up to 3000 V, 2000 A | Pulses >100 µs

The Static Parameter Power Semiconductor Test System STS8760 is specifically designed for testing the complete range of medium power to high power semiconductor components like DIODEs, MOSFETs or IGBTs, from low voltage to high voltage DUTs. The STS provides all instruments to perform tests of static semiconductor parameters, e. g. R_DS(ON), DS-Leakage, GS-Leakage and DS-Breakdown.
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).

Markets: Automotive | Semiconductor industry | Power electronics

Test methods: Functional | Parameter | High Power | Parallel

Handling: Fully automatic (in-line) | Half automatic | Manual

Key Features: Up to 10.000 A, 1500 V | Pulses >0.5µs

The Dynamic Parameter Power Semiconductor Test System DTS8765 is specifically designed for testing the complete range of semiconductor components like DIODEs, MOSFETs or IGBTs, from low voltage to high voltage DUTs. The DTS provides all instruments to perform tests of dynamic semiconductor parameters, e. g. Saturated, Double Pulse, Desaturated and Short Circuit Test.
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).