The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode. Also bare dies can be measured. The photo current can be measured independently of the photo tested diode. The supplied software is based on NI LabVIEW and provides basic measurements that can be individually adapted or expanded by the user.