Whitepaper
On this page you can find all of our Whitepapers and Application Notes. Normally, they should be available in English and German language. However, some Application Notes are only available in English language.
Isolated measurement instrumentation part 1: This is how to select oscilloscope, digitizer, and DMM
Once the appropriate measurement procedure has been selected and the test setup is determined, it is to select the instrument: oscilloscope, digitizer or DMM. We give tips on the selection of devices.
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Isolated measurement instrumentation part 2: The sum of measurement uncertainty and measurement error
Static measurements (DC) for isolated and non-isolated measuring equipment may result in measurement inaccuracies. We will show the possible reasons for this.
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Isolated measurement instrumentation part 3: Measuring accuracy and measuring ranges in dynamic AC measuring applications
If you are working in measurement technology, you cannot avoid measurement errors and measurement inaccuracies. In our whitepaper we show the effects of errors in the case of dynamic AC measurement.
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Cost-reduction and simplification: 1.000A high current RDS(on) static parameter DC testing vs. pulse testing @ 300μs
This whitepaper provides an example that shows how you can work around problems by calculating for testing the RDS(on) static on-resistance parameter of a MOSFET.
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Application Note: How to integrate a VX Instruments PXM7820 Multi-Measurement-Device into a Pickering LXI Chassis
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