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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode. Also bare dies can be measured. The photo current can be measured independently of the photo tested diode. The supplied software is based on NI LabVIEW and provides basic measurements that can be individually adapted or expanded by the user.
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Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
Further, our systems save you costs and space, as they are both parallel test-capable and enable combined testing. This means you need fewer test fixtures, less floor space in your production, less storage space and, above all, less handling- and testing time!
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The Static Parameter Power Semiconductor Test System STS8760 is specifically designed for testing the complete range of medium power to high power semiconductor components like DIODEs, MOSFETs or IGBTs, from low voltage to high voltage DUTs. The STS provides all instruments to perform tests of static semiconductor parameters, e. g. RDS(ON), DS-Leakage, GS-Leakage and DS-Breakdown.
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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The Dynamic Parameter Power Semiconductor Test System DTS8765 is specifically designed for testing the complete range of semiconductor components like DIODEs, MOSFETs or IGBTs, from low voltage to high voltage DUTs. The DTS provides all instruments to perform tests of dynamic semiconductor parameters, e. g. Saturated, Double Pulse, Desaturated and Short Circuit Test.
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
