We Don’t Test Limits. We Move Them. VX Instruments at electronica 2026

Munich gets electric again this November: we’re at electronica 2026 under the motto “We Don’t Test Limits. We Move Them.”

On its way into the application, a power semiconductor is tested several times: on the wafer, as a bare die, in its package and in the module. We support you at every one of these stages, for Si, SiC and GaN. One partner for the whole chain.
At our booth we show three application examples along this chain: wafer, known good die and TPAK. We also present our STS8760neo static test system and the configurable testhead of our DTS8765neo dynamic system.

Another highlight is the talk by our colleague Alexander Loibl: “Optimizing Test Speed to reduce Test Costs”. He speaks at the Measurement Technology Forum on November 12, 4:30 p.m. right next door in Hall A5.

Find all the details, meeting booking and your free ticket voucher here.