Test Systems

Our semiconductor test systems stand out for their exceptional performance, precision, and speed. Their modular architecture allows you to configure systems that meet every test requirement, from wafer-level characterization to final module validation. Each system is built to support your evolving power electronics testing needs, ensuring consistent accuracy and efficiency across all stages of production.

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Static

Static Semiconductor Test System

STS8760neo Semiconductor Test System

  • Up to 3,000 V | 2,400 A | Pulse length down to 100 μs
  • Accuracy down to pA-resolution
  • Optimized for high-speed production testing with ready-to-run sequencing software
  • Very low noise levels due to isolated measurement technology and high-side measurements
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Dynamic

dynamic semiconductor test system

DTS8765neo Semiconductor Test System

  • High Performance: Up to 2,000 V | 20,000 A
  • Short test times < 500 ms
  • Very low parasitic inductance down to 5 nH
  • Customizable modular design
  • Expandable for static AND dynamic tests
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Functional Test

LTS8620 Modular Laser Diode Test System (PXI/PXIe)

  • Modular PXI test system for testing and qualifying laser diodes
  • Extremely short current pulses
  • Fully automatic (in-line) | half automatic | manual
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In-Circuit & Functional Testing

GT4210 Modular In-Circuit & Functional Test System

  • Fully automatic (in line) | half automatic | robot handled manual
  • Up to 4640 Test Points
  • 20 Slots (PCI, PXI, PXIe)
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Software

Software

Generic Test Studio

  • High test speed
  • Flexible adaptation
  • Easy creation of test programs
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