Semiconductor Test System (dynamic)

  • Customizable modular design, e.g. 2,000 V | 10,000 A or 1,500 V | 20,000 A
  • Very low DC link inductance
  • Expandable for static AND dynamic tests
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System Overview

The DTS8765neo Dynamic Parameter Power Semiconductor Test System is built for high-speed and precise testing of medium to high-power semiconductor components, such as diodes, MOSFETs, and IGBTs, across a wide voltage range. It supports a comprehensive suite of dynamic parameter tests „Safe operating area“ and includes a modular PXI platform with an open interface, allowing for additional testing options, including DUT-specific resistor networks and temperature sensors. It can be easily expanded to perform dynamic as well as static tests on one test station. Its innovative testhead features an application-specific board for adapting DUTs, which enables a cable-free contacting and thus a very low parasitic inductance.

Your benefits

  • High performance: up to 2,000 V | 20,000 A, short test times < 500ms, very low parasitic inductance down to 5nH
  • Cost-efficient: integrated static pre-tests reduce test times and ensure a very low cost-per-test
  • Flexible: Modular design to adapt to customer requirements, fast integration times, easy maintainability, high common part rate for spare parts
  • Easy re-use: Designed for re-use of major instruments/components
  • Handler-independent: Short integration times for new DUTs and machine suppliers
  • Safe: Emergency shutdown in less than 200 ns
  • Compact: Saves valuable floorspace

Technical Features

Additional Options

Up to 2,000 V | 20,000 A | ETT < 500 ms | parasitic inductance down to 5 nH

 

  • Multi-site and multi-station test capability
  • Expandable measurement equipment options via PXI(e)
  • Optional static parameter & dynamic parameter tests (e.g. Idss, Igss, avalanche, DRB)

Highlights

Flexibility:

  • Compatible with all sequencers
  • Tool-free product changeover allows quick and easy transitions to different DUTs, enabling mixed-product lines with no setup time required
  • Modular design, expandable, customizable
  • 19″ form factor for testhead cartridges

Product Safety:

  • Emergency shutdown ensures protection of contacting and test systems, with shutdown capability in less than 200 ns
  • Adjustable current limitation provides additional protection for contacting
  • Bypass current path

High Performance:

  • High Bandwidth capability
  • Minimal inductance enables operation close to product limits. Low stray inductance down to 5 nH, even without a snubber network

Cost Reduction:

  • Integrated static pre-tests reduce costs and increase flexibility
  • Cost-effective solution with applications for new DUT

 

User-friendly and expandable:

Open for integration of 3rd-party instruments (e.g. customer specific oscilloscopes)

 

Applications

Our dynamic test system DTS8765neo has been developed for medium- to high-power semiconductor components and is capable of testing both low- and high-voltage DUTs. The high-performance semiconductor test system covers a wide range of applications and is particularly suitable for testing wide bandgap components (SiC, GaN).

Typical DUTs include, among others:

  • MOSFETs
  • Diodes

Testlevel: Module | Discrete | Known Good Die (KGD) | Laboratory / Characterization

DUTs: KGD, MOSFETs, Diodes

Tests

Schematic Overview

MOSFETs: according to IEC60747-8 standards
IGBT: according to IEC60747-9 standards

RBSOA | FBSOA
E_ON | E_OFF| E_RR | Imax_pulse_ | Udsmax_pulse_x (Highside switch) | Ugsmax_pulse_x (Highside Switch) | Udsmax_pulse_x (Lowside switch) | Ugsmax_pulse_x (Lowside Switch) | du/dt | di/dt

SCSOA
E_ON (Highside Switch) | E_OFF (Lowside Switch) | Imax | Udsmax (Highside Switch) | Ugsmax (Highside Switch) | Udsmax (Lowside Switch) | Ugsmax (Lowside Switch)

DTS8765neo: Test System Main Components

Software

The user-friendly GT-Studio software comes pre-installed on all our dynamic test systems DTS8765neo. It includes a library of predefined test methods, allowing you to create your test programs easily via drag-and-drop — completely without any programming effort.
The system automatically validates programs and inputs, prevents errors, and ensures consistent, precise results. Unlike open-market solutions that often require programming knowledge and are therefore more error-prone, GT-Studio focuses on ease of use: test programs can be created within minutes and scaled flexibly. At the same time, the software remains open for individual customization — 3rd-party instruments can also be integrated. Customer-specific tests are supported via an open C-DLL API.

Your benefits at a glance

  • Save time: Create test programs in minutes instead of hours
  • Avoid errors: Automatic validation ensures reliable results
  • Reduce costs: No need for additional programming personnel
  • Stay flexible: Easily scalable and open for 3rd-party integration
  • Faster to market: Shorter development and test cycles accelerate your time-to-market
GT Studio Test Software
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