STS8760neo Advanced Static Parameter Power Semiconductor Test System

  • Cost-efficient testing of your power semiconductors
  • High precision
  • Modular flexibility
  • Highspeed testing ensures a low cost per test
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System Overview

The STS8760neo Static Parameter Power Semiconductor Test System is built for high-speed and precise testing of medium to high-power semiconductor components, such as diodes, MOSFETs, and IGBTs, across a wide voltage range. The system supports a comprehensive suite of static parameter tests and includes a modular PXI platform with an open interface, allowing for additional testing options, including DUT-specific resistor networks and temperature sensors.

Your benefits

  • Cost-efficient: Particularly fast and multi-station capable – ensures high throughput and reduces testing costs
  • Precise: The VXI 6-Wire and zero-leakage design ensure accurate, repeatable results
  • Flexible: The static semiconductor test system is easily reconfigurable with modular instrument options for different test requirements
  • Scalable: Multi-station- and multi-site-capabilities enable expanded testing coverage
  • User-friedly: Easy to use by operating personnel thanks to intuitive software
  • Rapid market-readiness: Accelerated test system configuration and application development lower time-to-market
  • Reusable: Designed for the reuse of key instruments and components

Technical Features

Additional Options

Up to 10,000 V | 2,400 A | Puls length > 100 µs | Accuracy down to pA-Resolution

  • Multi-site and multi-station test capability
  • Expandable measurement functionalities via PXI and other interfaces
  • Optional insulation tests

Highlights

  • Optimized for high-speed production testing with ready-to-run sequencing software
  • High-speed instrument interfacing
  • Very low noise levels due to isolated measurement technology and high-side measurements
  • Complete guarding for reduced leakage and improved precision
  • Low parasitic inductance from instruments to the DUT
  • Stress reduction for adapter and test specimen thanks to very short pulse currents (up to 2,400A, 100 μs)
  • High-speed switching matrix design minimizes test times
  • Available with our easy-to-use test software GT Studio or fully programmable
  • Separate Source Measurement Units (SMUs) tailored for high-current and high-voltage needs
  • Separate generator and CMU/VMU

Highlights

Our Static Power Semiconductor Test System STS8760neo was developed for medium- to high-power semiconductor components and can test both low- and high-voltage DUTs. The high-performance semiconductor test system covers a wide range of applications and is particularly suitable for testing wide bandgap components (SiC, GaN).

Typical DUTs include:

  • Wafer
  • Bare Die
  • IGBTs
  • MOSFETs
  • Diodes

Testlevel: Molded Module | DCB | Wafer / Bare Die

Tests

Functional Tests | Parameter Tests | High Power Tests | Parallel

Schematic Overview

Testing capabilities (examples)

MOSFETs: RDS(on), DS-Leakage, GS-Leakage, DS-Breakdown according to IEC60747-8 standards
IGBT: CE-ON Voltage, CE-Leakage, GE-Leakage, CE-Breakdown according to IEC60747-9 standards

Measurement parameters:

  • Forward voltage
  • Reverse current
  • Threshold voltage
  • Static resistance

Software

The user-friendly GT-Studio software comes pre-installed on all our STS8760neo static parameter power semiconductor test systems. It includes a library of predefined test methods, allowing you to create your test programs easily via drag-and-drop — completely without any programming effort.
The system automatically validates programs and inputs, prevents errors, and ensures consistent, precise results. Unlike open-market solutions that often require programming knowledge and are therefore more error-prone, GT-Studio focuses on ease of use: test programs can be created within minutes and scaled flexibly. At the same time, the software remains open for individual customization — 3rd-party instruments can also be integrated. Customer-specific tests are supported via an open C-DLL API.

Your benefits at a glance

 

  • Save time: Create test programs in minutes instead of hours
  • Avoid errors: Automatic validation ensures reliable results
  • Reduce costs: No need for additional programming personnel
  • Stay flexible: Easily scalable and open for 3rd-party integration
  • Faster to market: Shorter development and test cycles accelerate your time-to-market
GT Studio Test Software
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