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TXS8000 Multi Site Semiconductor Testsystem

Features:

  • High performance functional test system
  • Open and modular architecture
  • Based on VXI-Bus or PXI-Bus architecture
  • Flexible and powerful signal routing
  • Designed for high precision and high speed measurements
  • Extremely high throughput testing


The TXS8000 Multi Site Semiconductor Testsystem is the ideal test solution for mixed signal Devices or Units Under Test (DUT/UUT). The open and modular architecture allows a wide range of applications to be tested by this system. This architecture allows to adapt to different applications easily.
The overall architecture consists of a Windows NT based controller running the National Instruments LabWindows/CVI or LabView software. The controller is connected to the VXI-Bus or PXI-Bus based instrument rack.
The test system resources (instruments, loads and power supplies) are routed to the Unit Under Test (UUT) through the Instrument-Matrix and Power-Matrix cards that plug into the VX8500 switch unit.

Product information:
The VX8800 Functional Test System has an open platform and relies on industry standard instrumentations.
For high end applications the system can be configured with instrumentations based on the VXI-Bus architecture.
For medium applications the system can be configured based on the PXI-Bus architecture.
In addition the system can be supplemented with any traditional rack and stack devices controlled by the IEEE-488 bus or via ethernet (LXI).

 

VX8500 Switch Unit (14-Slot)
The true core of the platform lies in the switch unit. The programmable switch unit is used for instrumentation switching, plus switching power supplies and loads to or from the Unit or Device under Test (UUT/DUT). A powerful controller is connected to the switch unit via an digital I/O interface. The system resources are routed to the UUT/DUT through the Signal Matrix either direct or via an 16 bit wide analog bus. The analog bus is daisy-chained from card to card to route any signal to or from any UUT pin.

Instrument Matrix Card
The instrument matrix card consists of a 8x16 matrix, which provides connections into or out of the system for 8 rows into 16 columns. All 16 columns have access to the analog bus. The instrument matrix card has a relay settling time of <1ms. Each channel supports up to 1A.

Power Matrix Card
The power matrix card consists of a 8x16 matrix, which provides connections into or out of the system for 8 rows into 16 columns. All 16 columns have access to the access to the analog bus. Each channel supports up to 2A.

High Current Matrix Card
The high current matrix card consists of a 8x16 matrix, which provides connections into or out of the system for 8 rows into 16 columns. All 16 columns have access to the analog bus. Each channel supports up to 6A.

High Frequency Matrix Card
The high frequency matrix card consists of a 4x4 50Ohm matrix, which provides connections into or out of the system for 4 rows into 4 columns. All 4 columns have access to the analog bus. For more information and detailed specification please contact us.

Tester Interface
The switching unit interconnects via the Mass Interconnect to the Unit Under Test (UUT). The tester interface consists of an receiver interface and an Interchangeable Test Adapter (ITA) from Virginia Panel, each having its own connector blocks and matching pins. The ITA inserts into the receiver and locks in place.

The TXS8000 Multi Site Semiconductor Testsystem from VX Instruments is a commercial of the shelf platform for Electronics Functional Test.

Test Engineering Challenges
On time test deployment within budget is your responsibility. To accomplish this, the test system utilized must provide adequate test coverage and test times while ensuring the manufacture of quality products. In developing a test platform, you must balance three competing goals:
Time , test development, execution and system deployment
Cost , capital and integration
Scope , throughput, accuracy and flexibility


Competing in today's electronic manufacturing environment means using reusable, scaleable test platforms that meet the evolving test requirements.